Nearfield and Technolution partner-up for metrology solutions

Collin Arocho
Leestijd: 1 minuut

TNO spinoff Nearfield Instruments has announced a new strategic partnership with technology integrator Technolution. The Rotterdam-based semiconductor metrology company will look to Technolution to provide expertise in value engineering and industrialization of the Quadra line, Nearfield’s first product that is to be produced in series. The Gouda-based integrator will develop and deliver critical electronics modules, with a focus on improving manufacturability, SEMI compliancy and performance enhancement, as well as value engineering some of its product’s sub-systems.

“We are proud of being successful in designing and building NFI’s high-speed data acquisition system and the related system control including integrating several subsystems and operating elements needed. We worked closely with NFI to solve the complex electromechanical puzzle of the scanning probes in the core of this semiconductor metrology tool,” says Jan van der Wel, founder and CEO of Technolution. “The innovation of NFI unlocks the great potential of Scanning Probe Microscopy such as in-line wafer metrology during semiconductor production. The potential emphasizes the importance of setting up a partnership for the industrialization and world-wide support of the technology to guarantee the reliability and availability of NFI’s products and services to its customers.”

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